<em>Multiple modal X-ray microtomography at SSRF</em> — ICTMS Committee Dep of Applied Maths Australian National University

Multiple modal X-ray microtomography at SSRF

Multiple modal X-ray microtomography at SSRF (120)

Tiqiao Xiao ¹

Shanghai Synchrotron Radiation Facility/Zhangjiang Lab, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Pudong New District, SHANGHAI, China

Conventional X-ray microtomography is based on absorption contrast and limited on microstructure analysis. With the combination of absorption/phase contrast and fluorescence, diffraction, scattering information, X-ray microtomography is capable for nondestructive and quantitative investigation on microstructures and components of low Z and high Z materials, elements distribution, crystal grain distribution and orientation, nano particle distribution and morphology.

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Xiao, T

opic: multi-modal tomography at SSRF T.Q received his Ph.D in Optics at the Chinese Academy of Sciences. He is now the deputy director of Shanghai Synchrotron Radiation Facility(SSRF). He is the standing member of Shanghai Nuclear Society and the China Synchrotron Radiation Society. He is also the committee member of China Society for Measurement (ionizing radiation). His research fields include X-ray Optics, Imaging Optics and related applications. He is the project leader of several multi-million CNY grants including the state key research and development program "Nano Science and Technology". He has been awarded the "Shanghai Science and Technology Progress Award", "outstanding science and technology achievement prize of the Chinese Academy of Sciences", "Shanghai Science and Technology Progress Award", and the "National Science and Technology Progress Award". He has authored over 200 research papers. He has supervised more than 30 graduate students.

Multiple modal X-ray microtomography at SSRF (120)

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