Material Identification at Nanometer Scales Using Single-Shot Hyperspectral Ptychography — ICTMS Committee Dep of Applied Maths Australian National University
  1. Schedule
  2. Theme 1: Hardware and acquisition techniques for tomography
  3. Material Identification at Nanometer Scales Using Single-Shot Hyperspectral Ptychography

Material Identification at Nanometer Scales Using Single-Shot Hyperspectral Ptychography (130)

Frederic Van Assche 1 , Silvia Cippicia 2 , Darren J Batey 2 , Sander Vanheule 1 , Thomas Sheppard 3 , Juriaan Vanmechelen 1 , Matthieu N Boone 1 , Christophe Rau 2
  1. UGCT-RP, Ghent University, Gent, Belgium
  2. Diamond Light Source, Didcot, UK
  3. IKFT, Karlsruhe Institute for Technology, Eggenstein-Leopoldshafen, Germany

 

First proof of principle combination of hard x-ray ptychography with hyperspectralimaging at the I13-1 branch of DLS. Single shot discrimination of Ni versus Cu has beendemonstrated at 96 nm pixel size using K-edge subtraction, as well as measurement of theNi K-edge spectral profile from a single ptychographic acquisition.

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