Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles. (129)
Grazing incidence X-ray ptychography is a promising technique for investigation of thin sub-monolayer filmsof nanoparticles. Preliminary results on a reconstruction of a test sample are presented.A potential impact for characterization of surface energy, particle size and growthdue to Ostwald ripening is expected