<em>Grazing incidence X-ray ptychography for in situ studies of </em><em>thin sub-monolayer films of nanoparticles.</em> — ICTMS Committee Dep of Applied Maths Australian National University

Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles. (129)

Azat M Slyamov 1 , Peter S Jørgensen 1 , Christian Rein 1 , Michal Odstrčil 2 , Jens W Andreasen 1
  1. Technical University of Denmark, Roskilde, Denmark
  2. Paul Scherrer Institut, Villigen, Switzerland

Grazing incidence X-ray ptychography is a promising technique for investigation of thin sub-monolayer filmsof nanoparticles. Preliminary results on a reconstruction of a test sample are presented.A potential impact for characterization of surface energy, particle size and growthdue to Ostwald ripening is expected

Full Paper